Dr. Kevin Xie's group at Texas A&M is planning to recruit two Ph.D. students and a postdoctoral research fellow starting 2018.
The overarching aim of the research projects is to understand mechanics of materials at nano- and sub-micron scales by applying advanced microstructural characterization techniques such as Cs-corrected STEM, TEM- based orientation mapping, EELS, and atom probe tomography. The details of the projects are as follows:
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