http://imechanica.org/node/2743 Comments for "Buckling behavior of metal film/substrate structure under pure bending" en http://imechanica.org/node/2743 <p>Many studies on the thin film/substrate structure and its failure mechanism were reported in recent years. The direct experimental results of thin film/substrate structure by scanning electron microscopy (SEM) presents an intriguing problem:there exists a buckling failure mechanism at the lateral edge of metal film under pure bending. The qualitative theoretical analysis has been done on such buckling failure of thin film/substrate structure. The experimental results and theoretical analysis are helpful to understand the extrinsic stresses or deformations that are induced by external physical effects. Accepted by Appl. Phys. Lett.</p> <br class="clear" /> http://imechanica.org/node/2743#comments research buckling pure bending thin film Fri, 22 Feb 2008 21:31:35 -0500 Ying Li 2743 at http://imechanica.org