Symposium: Plasticity and Damage Size Effects at the Micron and Nano Length Scales

Rashid K. Abu Al-Rub — Fri, 26 Jan 2007 19:08:59 -0500

The SES 2007 Conference, Oct. 21-24, 2007, Texas A&M University campus in College Station, Texas, home to the George Bush Presidential Library and Museum.

Symposium: Plasticity and Damage Size Effects at the Micron and Nano Length Scales

Call for papers

The emerging areas of micro- and nano-devices exhibit important strength differences that result from continuous modification of the material microstructural characteristics with changing size, whereby the smaller is the size the stronger is the response. This resulted in an increasing need for basic research to better understand the underlying deformation mechanisms at the micron and nano length scales. For example, experimental works have shown increase in strength by decreasing the particle size in particle-reinforced composites, the diameter of thin wires in micro-torsion and uniaxial compression, the thickness of thin films in micro-bending and uniaxial tension, the grain size of polycrystalline materials, void size in porous media, the indentation depth in micro/nano indentation tests etc.

This symposium focuses upon presenting experimental, theoretical, and/or computational results that will increase our understanding of the deformation mechanisms responsible for size effects at the micron and nano length scales in metals and metal alloys, ceramics, polymers, composites, etc. Presentation topics include but are not limited to the following areas: Size effect in thin films, composites, micro/nano indentation, fracture toughness, fatigue resistance, initial yield strength, and hardening; grain size effect; surface and interface effects; strain-gradient plasticity/damage theories; dislocation mechanics; size effect testing techniques; and measurement of material length scales.

Organizers

George Z. Voyiadjis, voyiadjis@eng.lsu.edu

Louisiana State University

Rashid K. Abu Al-Rub, abualrub@cua.edu

Catholic University of America

Cemal Basaran, cjb@eng.buffalo.edu

The State University of New York at Buffalo

iMechanica - Symposium: Plasticity and Damage Size Effects at the Micron and Nano Length Scales - Comments

Symposium: Plasticity and Damage Size Effects at the Micron and Nano Length Scales