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A critical thickness condition for graphene and other 2D materials

Harley T. Johnson's picture

B. C. McGuigan, P. Pochet, and H. T. Johnson, Critical thickness for interface misfit dislocation formation in two-dimensional materials, Phys. Rev. B 93, 214103, 2016.

URL: http://link.aps.org/doi/10.1103/PhysRevB.93.214103

In this work, we report a critical thickness analysis for dislocation formation in 2D lateral heterostructures.  The analysis applies to graphene, h-BN, and other 2D materials.  We compare a fully atomistic approach to a continuum critical thickness theory, for the limiting cases of thin "films" on much thicker "substrates", and for cases in which the "film" and "substrate" are of comparable thickness -- also known as the compliant substrate case.  By comparing atomistic and continuum formulations, we compute the effective dislocation core cutoff radii for graphene and h-BN, as well as the dislocation core energies.  The work provides a comprehensive critical thickness analysis for 2D materials, and paves the way for defect-free growth of strained 2D lateral heterstructures.

graphene/h-BN interface misfit dislocation

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Yanfei Gao's picture

Nice work!

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