Simpleware Ltd. and COMSOL Inc. announced at the COMSOL Users Conference 2007 in Grenoble a partnership agreement to provide an export interface from Simpleware's world-leading 3D image-based meshing software +ScanFE™ to COMSOL Multiphysics® 3.4, the industry's foremost multiphysics simulation environment. The +ScanFE interface enables COMSOL users to directly import high-quality meshes generated from MRI, CT, and MicroCT scan data into COMSOL Multiphysics 3.4 for modelling and simulation without requiring re-meshing or pre-processing.

Simpleware Ltd., the world leader in image-based meshing software, has signed a reseller agreement with Vangest Group, a provider of most advanced solutions in project, development and manufacturing.

Invitation to join the Google group  Mechanics: Modeling, Experimentation and Computation

The linked two of my studies can be used as references for Zhigang’s lecture on Instabilities.

(1) Catastrophic fracture

Background of Study

• Non destructive evaluation (NDE) application
• Based on industrial CT scan
• Visualisation and segmentation of internal anomalies

Background of Study

• Based on X-ray tomography (XMT)
• Multi-part FEA model
• Scan to mesh in 10 minutes

Aluminum-based particulate-reinforced metal matrix composites (PMMCs) frequently have a heterogeneous distribution of reinforcement particles whether produced by a powder or liquid processing route. The applicability of X-ray microtomography (XMT) for the characterization of this heterogeneity and its influence on final properties was investigated, for the case of a powder blended and extruded AA2124 matrix with Ni particulate. Simpleware software was used to quantify the embedded Ni particle size distribution and the extent and texture of clusters formed.

Simpleware Ltd., the world leader in image-based meshing software, has signed an agreement with Gaitech International Ltd. to resell the Simpleware suite of software products in China, Hong Kong, Taiwan and Macao.

I would like to share the research work I have been pursuing over the past four years. I believe, through this forum, I will be able to reach researchers with various backgrounds and expertise. Suggestions and comments from members will be very useful. I am also attaching links to preprints of manuscripts describing this work. Please follow these links:

by S. Yip (Editor), 2005

Book Review
"A new guide to materials modeling largely succeeds in its aim to be the defining reference for the field of computational materials science and represents a huge undertaking..." -- by James Elliott | University of Cambridge, Materials Today, Volume 9, Issues 7-8, July-Aug 2006, Pages 51-52.

Book Description
The first reference of its kind in the rapidly emerging field of computational approachs to materials research, this is a compendium of perspective-providing and topical articles written to inform students and non-specialists of the current status and capabilities of modelling and simulation. From the standpoint of methodology, the development follows a multiscale approach with emphasis on electronic-structure, atomistic, and mesoscale methods, as well as mathematical analysis and rate processes. Basic models are treated across traditional disciplines, not only in the discussion of methods but also in chapters on crystal defects, microstructure, fluids, polymers and soft matter. Written by authors who are actively participating in the current development, this collection of 150 articles has the breadth and depth to be a major contributor toward defining the field of computational materials. In addition, there are 40 commentaries by highly respected researchers, presenting various views that should interest the future generations of the community. Subject Editors: Martin Bazant, MIT; Bruce Boghosian, Tufts University; Richard Catlow, Royal Institution; Long-Qing Chen, Pennsylvania State University; William Curtin, Brown University; Tomas Diaz de la Rubia, Lawrence Livermore National Laboratory; Nicolas Hadjiconstantinou, MIT; Mark F. Horstemeyer, Mississippi State University; Efthimios Kaxiras, Harvard University; L. Mahadevan, Harvard University; Dimitrios Maroudas, University of Massachusetts; Nicola Marzari, MIT; Horia Metiu, University of California Santa Barbara; Gregory C. Rutledge, MIT; David J. Srolovitz, Princeton University; Bernhardt L. Trout, MIT; Dieter Wolf, Argonne National Laboratory.