Depolarization field and misfit strain are two important factors that may greatly influence the properties of ferroelectric thin films. The effect of depolarization field on polarization states of single-domain ferroelectric thin films with nonequally biaxial in-plane misfit strains are studied in the present work by numerically solving three coupled Euler-Lagrange equations, which are derived from the minimization of total free energy.

Polarization switching-induced shielding or anti-shielding of an electrically permeable crack in a mono-domain ferroelectric material with the original polarization direction perpendicular to the crack is simulated by a phase field model based on the time-dependent Ginzburg-Landau equation. The domain wall energy and the long-range mechanical and electrical interactions between polarizations are taken into account. The phase field simulations exhibit a wing-shape- switched zone backwards the crack tip. The polarization switching-induced internal stresses shield the crack tip from applied mechanical loads.

The Eighth International Conference on Fundamentals of Fracture (ICFF VIII) is the successor of the previous seven held at NBS, Gaithersburg (USA, 1983), Gatlinburg (USA, 1985), Irsee (Germany, 1989), Urabandai (Japan, 1993), NIST, Gaithersburg (USA, 1997), Cirencester (UK, 2001), and Nancy (France, 2005). You are warmly invited to participate in ICFF VIII which will be held 3-7 January 2008 in Hong Kong University of Science and Technology, Hong Kong, and in Guangzhou, China. As the previous conferences, ICFF VIII provides an international forum for presentation and discussion of the latest scientific and technological development in fundamentals of fracture. The general theme of ICFF VIII is to cover all aspects of fracture at a fundamental level, including contributions from those working in the disciplines of Continuum Mechanics, Physics, Chemistry, Bioscience, Metallurgy, Ceramics, Polymer Science, etc. You are cordially invited to submit an abstract to join in this memorable event.