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Mike Ciavarella's picture

1st International IEEE Workshop on Metrology for Aerospace. Benevento, Italy, May, 29-30, 2014.

Dear Colleagues and Friends,

We are pleased to invite you to contribute to the 1st International IEEE Workshop on Metrology for Aerospace. 

The event is co-technical sponsored by two IEEE Societies, AESS and IMS. 
The event includes but is not limited to new technology for metrology-assisted production in aerospace industry, aircraft component measurement, sensors and associated signal conditioning for aerospace, calibration methods for electronic test and measurement for aerospace.

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