R. Huang, Applied Physics Letters 87, 151911 (2005).

The stability of a conductive thin film on a dielectric substrate subjected to a transverse electric field and a residual strain is analyzed. Under a uniform electric field, an equilibrium state exists with a constant thickness reduction of the substrate. The equilibrium state however can be unstable, depending on the intensity of the electric field, the stiffness and Poisson’s ratio of the substrate, and the residual strain in the film. Based on a linear perturbation analysis, the critical condition is determined, beyond which wrinkling of the film is predicted.