Symmetry breaking, snap-through, and pull-in instabilities under dynamic loading of microelectromechanical shallow arches
Arch-shaped microelectromechanical systems (MEMS) have been used as mechanical memories, micro-relays, micro-valves, optical switches, and digital micro-mirrors. A bi-stable structure, such as an arch, is characterized by a multivalued load deflection curve. Here we study the symmetry breaking, the snap-through instability, and the pull-in instability of a bi-stable arch shaped MEMS under static and dynamic electric loads.<!--break--> Unlike a mechanical load, the electric load is a nonlinear function of the a priori unknown deformed shape of the arch.