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electronic interconnects

Finite-Element Analysis of Current-Induced Thermal Stress n a Conducting Sphere

Submitted by hasanzhong on

Understanding the electrothermal-mechanical behavior of electronic inter-

connects is of practical importance in improving the structural reliability of

electronic devices. In this work, we use the finite-element method to analyze

the Joule-heating-induced thermomechanical deformation of a metallic sphere

that is sandwiched between two rigid plates. The deformation behavior of the

sphere is elastic–perfectly plastic with Young’s modulus and yield stress

decreasing with temperature. The mechanical stresses created by Joule