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A multi-scale modeling framework for instabilities of film/substrate systems

Spatial pattern formation in stiff thin films on soft substrates is investigated from a multi-scale point of view based on a technique of slowly varying Fourier coefficients. A general macroscopic modeling framework is developed and then a simplified macroscopic model is derived. The model incorporates Asymptotic Numerical Method (ANM) as a robust path-following technique to trace the post-buckling evolution path and to predict secondary bifurcations.

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Bridging techniques in a multi-scale modeling of pattern formation

F. Xu, H. Hu, M. Potier-Ferry, S. Belouettar

International Journal of Solids and Structures (2014), doi: http://dx.doi.org/10.1016/j.ijsolstr.2014.05.011

 

Abstract:

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