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Nanoindentation: Oliver & Pharr Analysis

Submitted by Nirav Parekh on

Dear Members,

I am very new to field of nanoindentation and my question might appear too simple.

I am indenting an elastic - plastic material (polymer blend) with spherical indenter. I am well verse with hertz contact mechancis theory and indentation theories like Oliver & Pharr, JKR, DMT and few others.

Scholarship Support for Attending NSF Workshop on the BEM: Bridging Education and Industrial Applications

Submitted by Yijun Liu on

Sponsored by the National Science Foundation and the NSF Institute for Mathematics and its Applications, the University of Minnesota (Minneapolis, Minnesota, USA) is hosting a workshop on the boundary element method (BEM) April 23-26, 2012. This workshop consists of a two-day short course and a two-day colloquium on advances in the BEM with educational and industrial applications. Researchers and engineers from around the world, as well as students (both graduate and undergraduate) are invited to participate in this workshop.

Profilometer software for NDT surface roughness inspection

Submitted by profilometer on

Novacam 3D Profilometer Software

The Novacam three dimensional software programs are used with all Novacam Profliometers. The program permits the consumer to define how big the region, or line to be measured, along with the lateral resolution from the measurement.

Novacam's high end Data Acquisition Profilometer Software programs are incorporated with all of MicroCam non-contact profilometers.

Profilometers using Low Coherence Interferometry used by NASA to measures thickness

Submitted by profilometer on

Using a fiber-based optical profilometer NASA measures the thickness of liquid nitrogen in cryogenic chambers at its Propulsion Systems lab because these profilometers use fiber-based probes which can withstands the extreme environment, can be located hundreds of meters away from the interferometer and fit in the tight chamber which standard full-field profilometers with a human operator could not. The signal quality stays constant over the distance.

Nonlinear static in SAP 2000 (Problem with hinges assignment)

Submitted by hazrina on

Hi everyone,

Currently I am working with nonlinear static pushdown analysis in SAP 2000. I understand that when the analysis gives a warning 'unable to find a solution at step 20' means that the assigned hinges are compete to unload i.e where one hinges requires the applied load to increase while the other requires the load to decrease.

My question is, how are we going to overcome this warning?..Is there any better solution for this?

Looking forward for anyone to reply.

Best Regards,

Hazrina Mansor