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ASM Educational Symposium: Innovations in Mechanical Testing: From Molecules to Large Engineering Structures

Amit Shyam's picture

Dear iMechanica Readers,

Greetings from Oak Ridge.  
I would like to invite you, your colleagues and students to attend the annual Educational Symposium organized by the Oak Ridge Chapter of ASM International.  The theme for this year’s symposium is:

“Innovations in Mechanical Testing: From Molecules to Large Engineering Structures”

We have an outstanding list of speakers, which includes:

Ian Robertson (NSF) - "In situ TEM testing" (Keynote Speaker)
Markus Buehler (MIT) – "Atomistic and Molecular Mechanics"
Qian Yu (UC-Berkeley) – "In situ TEM Nanomechanics"
Roberto Ballarini (U of Minnesota) – "Mechanical Measurements with Microdevices"
Robert Wheeler (Microtesting Solutions) – "In situ SEM Micromechanics"
Nicholas Randall (CSM) – "High Temperature Nanoindentation"
Jerry Young (Boeing) – "From Atoms to Airplanes"
Kevin Hemker (Johns Hopkins) - "Strain Measurements at Nanoscale"
 
The symposium will be held at the Pollard Auditorium in downtown Oak Ridge on April 19, 2011.  More information about the symposium can be found at the following web-site:

http://www.ms.ornl.gov/ASM_Educational_Symposium/index.shtml

This event is being sponsored by several organizations and equipment manufacturers, who will display some of their products at the event.  We are also offering scholarships for students to participate.  Attached you will find a file with a flyer for the event.  Could you print some copies and post them on boards in your building, please?

Please feel free to distribute it among your colleagues and students.

Don’t hesitate to call me or my colleague Edgar lara-Curzio if you have questions.  

I look forward to seeing you at the symposium.

Yours sincerely,

Edgar Lara-Curzio                                Amit Shyam
865-574-1749                                        865-241-4841
laracurzioe_at_ornl.gov                       shyama_at_ornl.gov

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PDF icon ASM Ed Symp_Flyer_v10.pdf195.21 KB
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