To ensure the quality levels of applications spanning across nearly all industries, most R&D units have or are in the process of obtaining or updating their instruments to include surface measurement at various range. This would ensue before an exhausting list of instrument
options would have to be comparatively matched to fit user specific measurement requirements. Once the instrument is selected, it is only later that the user then identifies that their chosen instrument is not capable of broad and or expandable measurement use. It is
unfortunate that only at this point most recognize the true value of a single surface measurement instrument with broad capability from Macro through Angstrom range.
APPLICATION NOTE: http://www.nanovea.com/Application%20Notes/afmintegration.pdf