Microstructure and Stray Electric Fields at Surface Cracks in Ferroelectrics
This is the preprint of an article that will appear in the International Journal of Fracture (DOI: 10.1007/s10704-011-9670-2).
Microstructure and Stray Electric Fields at Surface Cracks in Ferroelectrics
by Lun Yang and Kaushik Dayal, Carnegie Mellon University
Abstract