MODELLING SOLDER JOINT RELIABILITY OF BGA PACKAGES SUBJECT TO DROP IMPACT LOADING USING SUBMODELLING
With the trend towards miniaturization and multi-functionality in products such as mobile electronic devices, miniature IC packaging such as fine pitch Ball Grid Array (BGA) package and Chip Size Package (CSP) are increasingly being used. However, the inherent vulnerability of these miniature IC packagings has brought along new reliability problems. Among them, the drop/impact robustness is the most challenging in terms of testing and designing.