A symposium on Mechanical Instabilities in Polymer Films, Interfaces and Nanostructures

This symposium is part of the Spring 2008 ACS National Meeting and Exposition , to be held at New Orleans, Louisiana, from Sunday, April 6 to Thursday, April 10, 2008.

Organizers: Christopher M. Stafford (NIST), Adam J. Nolte (NIST), Rui Huang (UT Austin)

Sponsors: ACS Division of Polymeric Materials: Science and Engineering (PMSE) and National Science Foundation

Technical Program:

• Session I: Mechanics and Biological Applications (8:30 AM - 11:40 AM, Monday, April 7, 2008)

8:30 AM:   Introductory Remarks

8:35 AM:   Zhigang Suo, Instabilities in soft active materials (invited)

9:05 AM:   Neville R. Moody, Effects of substrate compliance on fracture of thin hard films (invited)

9:35 AM:   Rui Huang, Wrinkling of anisotropic crystal films on soft substrates

9:55 AM:   Intermission

10:10 AM:   Hanqing Jiang, Finite width effect of thin films buckling on compliant substrate: Impact on metrology

10:30 AM:   Ryan C. Hayward, Creasing of hydrogels under compression: Harnessing an elastic instability to create active surfaces (invited)

11:00 AM:   Sahraoui Chaieb, Wrinkling instabilities in monolayers and bilayers made of chiral lipids

11:20 AM:   Khaled A. Aamer, Confinement and mechanical stiffening behavior of tyrosine-derived polycarbonate thin films

• Session II: Metrology and Thin Films (1:30 PM - 5:00 PM, Monday, April 7, 2008)

1:30 PM:   Thomas P. Russell, Capillary wrinkling of floating thin films (invited)

2:00 PM:   Jun Young Chung, Harnessing wrinkling instabilities for advanced measurements of polymeric thin films (invited)

2:30 PM:   Ray Gunawidjaja, Determination of silver nanowires elastic modulus by means of longitudinal buckling instability

2:50 PM:   Christopher M. Stafford, Measuring the modulus of hydrated contact lenses via surface wrinkling

3:10 PM:   Intermission

3:20 PM:   Lorraine F. Francis, Wrinkling of polymer coatings (invited)

3:50 PM:   V. V. Tsukruk, Buckling instability of nanocomposite polymeric structures: Measuring elastic properties of complex nanostructured materials (invited)

4:20 PM:   Adam J. Nolte, Effects of humidity on the thickness and Young's modulus of polyelectrolyte multilayer films

4:40 PM:   Zekeriyya Gemici, Strain-induced elastic buckling instability for mechanical measurements (SIEBIMM) on colloidal assemblies

• Session III: Devices and Patterning (8:30 AM - 12:00 Noon, Tuesday, April 8, 2008)

8:30 AM:   John A. Rogers, Wavy semiconductor nanomaterials for stretchable electronics (invited)

9:00 AM:   Kyle J. Alvine, Instability in nanoimprinted structures (invited)

9:30 AM:   Douglas P. Holmes, Wrinkling and snapping polymer surfaces

9:50 AM:   Dinesh Chandra, Fabrication of strain responsive microlens array by confined buckling of poly(dimethylsiloxane) bilayer structure

10:10 AM:   Intermission

10:25 AM:   M. D. Thouless, Mechanical properties and instabilities of PDMS surfaces (invited)

10:55 AM:   Takuya Ohzono, Spatial forcing of microwrinkle patterns (invited)

11:25 AM:   Shu Yang, Self-assembly of complex patterns by controlled mechanical instability in patterned polymer films (invited)

11:55 AM:   Concluding Remarks