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Symposium: Plasticity and Damage Size Effects at the Micron and Nano Length Scales

Submitted by Rashid K. Abu Al-Rub on

Dear Esteemed Researcher,

It is our pleasure to invite you to attend and submit an abstract to our symposium on โ€œPlasticity and Damage Size Effects at the Micron and Nano Length Scales'' to be held at The 45th Annual Technical Meeting of the Society of Engineering Science; October 12โ€“15, 2008 at the University of Illinois at Urbana-Champaign. If you are interested, abstracts can be submitted at: http://ses2008.mechse.uiuc.edu/content/call_for_abstracts/.

The deadline for submission of abstracts is June 2nd, 2008.

Symposium Organizers

Rashid K. Abu Al-Rub, rabualrub [at] civil.tamu.edu (rabualrub[at]civil[dot]tamu[dot]edu)

Texas A&M University

George Z. Voyiadjis, voyiadjis [at] eng.lsu.edu (voyiadjis[at]eng[dot]lsu[dot]edu)

Louisiana State University

Cemal Basaran,  cjb [at] eng.buffalo.edu (cjb[at]eng[dot]buffalo[dot]edu)

The State University of New York at Buffalo