Thin film thickness control is highly important to the manufacturing process of various highly demanded applications. The ideal
technique for assuring this control would be a highly accurate, non-contact, high speed measurement with no disturbance from
transparent and or reflective surfaces. Here we show the ideal capability of the Nanovea St400 Profilometer using 3D Non-Contact Metrology, step-height measurement.
APPLICATION NOTE: http://www.nanovea.com/Application%20Notes/thinfilmthicknessmeasurement.pdf