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Thin Film Thickness Measurement With 3D Metrology

NANOVEA's picture

Thin Film MetrologyThin film thickness control is highly important to the manufacturing process of various highly demanded applications. The ideal

technique for assuring this control would be a highly accurate, non-contact, high speed measurement with no disturbance from

transparent and or reflective surfaces. Here we show the ideal capability of the Nanovea St400 Profilometer using 3D Non-Contact  Metrology, step-height measurement.


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