research

Abstract - Indentation experiments on very thin films are analyzed by employing a rigorous solution to model elastic substrate effects. Two cases are discussed: elastic indentations where film and substrate are anisotropic, and elasto-plastic indentations where significant material pile-up occurs. We demonstrate that the elastic modulus of a thin film can be accurately measured in both cases, even if there is significant elastic mismatch between film and substrate. 

This manuscript has been accepted for publication in Journal of Materials Research.  

In order to obtain numerical solution of problemsthat involves a hyperelastic material model, we use what is known as incremental/iterative solution techniques of Newthon's type. The basic idea is to contruct a discrete system of nonlinear equation, KU=F, and solving it using a Newton's method or a modified version of it. As we know, its lead to a systematic linearization of the internal force vector and by the chain rule to the linearization of the material model.

Buckling of thin layers or aligned arrays of stiff materials on elastomeric substrates has many important applications, such as stretchable electronics, precision metrology and flexible optoelectronics.  These systems show one common phenomenon, the stiff thin layers buckle normal to the substrate surface (out-of-surface buckling).  By contrast, we recently reported for the first time that silicon nanowires (SiNWs) on elastomeric substrates buckle only within the substrate surface, i.e. in-surface buckling.  Experimental process to obtain buckled SiNWs is described.

We present an interesting application of ADINA FSI in the

analysis of biomimetic flying devices. Please see

http://www.adina.com/newsgH62.shtml

You can find many other examples of applications of ADINA in the

analysis of multiphysics problems here:

http://www.adina.com/multiphysics.shtml