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Jae-Hyun Kim's blog

Perturbation analysis of a wavy film in a multi-layered structure

A free surface in a multi-layer can experience an undulation due to surface diffusion during fabrication or etching process. In order to analyze the undulation, the elasticity solution for the undulating film is needed. Considering the undulation as a perturbation of a flat surface, a boundary value problem for 2D elasticity is formulated. The solution procedure is straightforward, but very lengthy especially for a multi-layer.

Interfacial toughness and mode mixity

When I was a graduate student, I spent several months to measure interfacial toughness between metalic (Cu and Au) films and thick substrates(Si and Polycarbonate). My methods were bulge test (blistering test) and 4-point bending test. I had many problems such as making an initial crack(pre-cracking), changing load phase angle applied to specimens, preparing/patterning thin films, constructing my own test apparatus, etc. The biggest problem was to measure the interfacial toughness over a wide range of loading phase angle. For a bimaterial with a non-zero oscillatory index(epsilon), we don't know the phase angle for a minimum interfacial toughness beforehand. Therefore, we need to measure the interfacial toughness over a wide range of phage angle. For engineering purpose, we need a minimum interfacial toughness value for reliability design because this value will lead to a conservative design of systems.

A short paper on T-stress of an interfacial crack in a bi-material strip

The attached file is on T-stress of an interfacial crack in a bi-material strip. The geometry of the problem is the same with that of Suo and Hutchinson (1990, IJF). Using a conservation integral technique, a formula for T-stress is derived with two numerical factors.

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