When I was a graduate student, I spent several months to measure interfacial toughness between metalic (Cu and Au) films and thick substrates(Si and Polycarbonate). My methods were bulge test (blistering test) and 4-point bending test. I had many problems such as making an initial crack(pre-cracking), changing load phase angle applied to specimens, preparing/patterning thin films, constructing my own test apparatus, etc. The biggest problem was to measure the interfacial toughness over a wide range of loading phase angle. For a bimaterial with a non-zero oscillatory index(epsilon), we don't know the phase angle for a minimum interfacial toughness beforehand. Therefore, we need to measure the interfacial toughness over a wide range of phage angle. For engineering purpose, we need a minimum interfacial toughness value for reliability design because this value will lead to a conservative design of systems.
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