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Lecture 15 Ratcheting induced slow crack (RISC)

Zhigang Suo's picture
  • Slides are attached.
  • Reading material: Section 4 of Z. Suo, " Reliability of interconnect structures." pp. 265-324 in Volume 8: Interfacial and Nanoscale Failure (W. Gerberich, W. Yang, Editors), Comprehensive Structural Integrity (I. Milne, R.O. Ritchie, B. Karihaloo, Editors-in-Chief).
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