- Slides are attached.
- Reading material: Section 4 of Z. Suo, " Reliability of interconnect structures." pp. 265-324 in Volume 8: Interfacial and Nanoscale Failure (W. Gerberich, W. Yang, Editors), Comprehensive Structural Integrity (I. Milne, R.O. Ritchie, B. Karihaloo, Editors-in-Chief).
| Attachment | Size |
|---|---|
| RISC ES 242r.pdf | 841.42 KB |