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Jie-Hua Zhao's picture

A PROBABILISTIC MECHANICS APPROACH TO DIE CRACKING

Flip-chip plastic ball grid array (FC-PBGA) packages are widely used in high performance components. However, its die back is normally under tensile stress at low temperatures. This paper presents a probabilistic mechanics approach to predict the die failure rate in the FC-PBGA qualification process. The methodology consists of three parts:

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