User login

You are here

Micro-mechanical device for quantitative in situ TEM nanowire testing

Yang Lu's picture

In a recent paper published on Nanotechnology , we have demonstrated the usage of a novel micro-mechanical device (MMD) to perform quantitative in situ tensile tests on individual metallic nanowires inside a transmission electron microscope (TEM). Our preliminary experiment on a 360 nm diameter nickel nanowire showed that the sample fractured at an engineering stress of ~ 1.2 GPa and an engineering strain of ~ 4%, which is consistent with earlier experiments performed inside a scanning electron microscope (SEM). With in situ high resolution TEM imaging and diffraction capabilities, this novel experimental set-up could provide unique opportunities to reveal the underlying deformation and damage mechanisms for metals at the nanoscale.

(Full text PDF attached) 

AttachmentSize
PDF icon Lu_Nanotechnology_355702_2011.pdf1.14 MB

Comments

L. Roy Xu's picture

Dear Dr. Lu,

Your results are great.  You couldn't measure the strain directly since
we cannot apply  LVDT or stain gauges to
nanowires. I guess your strain will be estimated from the displacement field.
Under such large strain, do you still use linear relation (strain is linearly related
to the displacement gradient) or you include large deformation correction?

Yang Lu's picture

Dear Prof. Xu,

Thanks for your interest in our work. You're right that we cannot directly apply LVDT or strain gauges on such tiny samples. However, we can obtain the elongation of the sample via the displacement reading from the quantitative nanoindenter as well as the direct measurement of real time video recording. The strain was therefore calculated as "engineering strain", with the help of FEA modeling or a simple response subtraction method (please see Ref. [29] for more detailed information).

Best, 

Subscribe to Comments for "Micro-mechanical device for quantitative in situ TEM nanowire testing"

Recent comments

More comments

Syndicate

Subscribe to Syndicate