Akanksha Garg, Craig Maloney

(accepted mannuscript in Journal of Mechanics and Physics of Solids)

These fragments of notes are intended for a course on fracture mechanics, but I have always run out of time, and have never managed to go over them in class.  Some of the ideas are mentioned in various parts of the class.  I have also listed refeences and review articles.

We would like to invite you to submit abstracts to the symposium on Mechanics and Electrochemistry of Energy Materials at the 53rd Annual Technical Meeting of the Society of Engineering Science (SES 2016) to be held at University of Maryland College Park (October 2-5, 2016).

Symposium Description

The stress intensity factor and Young's Modulus 

It is evident that stress intensity factor considered as  the most important factor in fracture mechanics which used for evaluating the stress state near to tip crack . However this factor depends up many parameters (such us normal loading, cracks size and its geometry). my question is as follow 

The stress intensity factor is depend of Young's modulus, How to identify the effect of Young's modulus on the variation of stress intensity factors. 

Experimental studies recently performed on single cancer and healthy cells have demonstrated that the former are about 70% softer than the latter, regardless of the cell lines and the measurement technique used for determining the mechanical properties.

Dear Colleagues,

We would like to invite you to consider submitting abstracts to the following minisymposium taking place as part of the Soceity of Engineering Sciences meeting to be hosted by the University of Maryland (October 4-7, 2016)

D-9 :Friction, Fracture and damage (http://ses2016.org/symposium-d-9-friction-fracture-and-damage/)

Ahmed Elbanna (University of Illinois Urbana Champaign) and K. Ravi-Chandar (University of Texas at Austin)

May 11 - 12, 2016 - St. Michael Cinema, St. Michael, MN

This two-day conference will include national and international speakers discussing the latest in Digital Radiography and Computed Tomography systems and technology. Current users of X-ray and Computed Tomography will gain more knowledge to improve their operations. Those new to the X-ray/CT scanning will hear from peers how they utilize the technology within their industry.

Simpleware at the NSI 30th Anniversary Symposium

Hi,